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Yarı iletken/IC

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Yarı iletken/IC

Form semiconductor material to semiconductor component, NGI covers the entire industry chain of the semiconductor testing, especially, NGI has developed the first set of national high-precision digital source meters for semiconductor comprehensive testing.


Uygulama örnekleriTest NesnesiTest ÖğeTest ParametresiÜrünü Tavsiye Et
Semiconductor assembly
Material property analysis
Energy efficiency&lighting
Pasif bileşen
Nanomaterial and device
vb.
IC chip(RF CPU AFE MCU ADC BMIC)
Diode MOS tube
fotoelektrik sensör
LED/AMOLED
Photovoltaic/solar cell
vb.
Resistivity analysis
Hall characteristics analysis
Wafer analysis
vb.



Turn-on voltage test
Aşırı akım
capability test
Sızıntı testi
Yaşlanma testi
Arıza testi
vb.


N 2600
N 9244
N 23010
N 23020
vb.

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